Zuberek, W.M. and Konczykowska, A.
Proc. IEEE Int. Symp. on Industrial Electronics (ISIE'95); 10-14 July 1995, Athens, Greece, pp.445-450.
Abstract:
In parameter extraction programs, the performance of repeated analyses of linear (or linearized) circuits can be significantly improved by representing the dependence of circuit responses on some parameters in a symbolic form. This symbolic form can then be evaluated very efficiently for different sets of parameter values. An intergrated numerical--symbolic parameter extraction program, called FIT--S, has been developed in which all linear circuit analyses can be performed using symbolic or numerical approach. A comparisons of execution times is presented for extraction of a submicron HEMT's parameters.
Keywords:
Parameter extraction, circuit simulation, symbolic simulation.
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