Self-heating effects and mixed-domain simulation in parameter extraction

Konczykowska, A. and Zuberek, W.M.

Proc. First Int. Conf. on Electronics, Circuits and Systems; Cairo, Egypt, 19-22 December 1994.

Abstract:

Device temperatures can play an important role in accurate determination of operating conditions and responses of circuits. Self-heating increases the device temperature because of the power dissipated in the device. An integrated electrical/thermal simulation is proposed, in which the DC analysis is combined with thermal analysis of the circuit. A practical implementation of such mixed-domain analysis is discussed for SPICE-like simulators, and its application is illustrated by the extraction of HBT parameters performed by the FIT parameter extractor.

Keywords:

Parameter extraction, circuit simulation, mixed-domain simulation, self-heating effects, SPICE-PAC, FIT.

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